4th International PV Module Quality Assurance Forum

October 10, 2013

Presentations are available for download:

• Welcome—Takahiro Wada, Ryukoku University
• Welcome—Tony Sample, JRC
• Japan's FIT Program and PV Reliability Assurance—Eiji Yamada, JET
• Differences between Qualification Tests, Comparative Tests and Service Life Predictions and How They Use Accelerated Stress Tests in Different Ways—John Wohlgemuth, NREL
• Results of Field Tests in Japan—Hiroshi Kato, JET
• Cutting Edge Quality Assurance for Technical Bankability VDE Quality Tested Program—Hideki Nishimura, VDE
• Accelerated Degradation Test for Commercial PV Modules—Shinji Kawai, SAGA-ITC
• PV+ Test—Jörg Althaus, TUV Rheinland
• Task Group 1: Progress Report—Yoshihito Eguchi, JET
• Thermal Runaway Test for Bypass Diode—Y. Uchida, JET
• Status of Task Gr. 8: Region Japan—Keizo Asaoka, Kaneka Corporation
• Proposal for Comparative PV Module Rating System—John Wohlgemuth, NREL